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PaperSilicon nanowire atomic force microscopy probes for high aspect ratio geometriesBrian A. Bryce, B. Robert Ilic, et al.Applied Physics Letters
PaperFast and long retention-time nano-crystal memoryHussein I. Hanafi, Sandip Tiwari, et al.IEEE Transactions on Electron Devices
PaperHigh-Frequency Response in Carbon Nanotube Field-Effect TransistorsDavid J. Frank, Joerg AppenzellerIEEE Electron Device Letters
