Kronig-Penney-type calculations for electron tunneling through thin disordered dielectric films

E. Stoll; T. Schneider

doi:10.1016/0038-1098(72)90536-4

Solid State Communications

Paper

01 Jan 1972

Kronig-Penney-type calculations for electron tunneling through thin disordered dielectric films

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Abstract

Kronig-Penney-type calculations were used to evaluate the tunneling probability through a thin disordered dielectric film between two metallic electrodes. Our calculations indicate that the tunneling probability increases with increasing disorder. © 1972.

Conference paper