Conal E. Murray, I.C. Noyan
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
The elastic anisotropy of copper leads to significant variation in the x-ray elastic constants (XEC), which link diffraction-based strain measurements to stress. An accurate depiction of the mechanical response in copper thin films requires a determination of an appropriate grain interaction model that lies between Voigt and Reuss limits. It is shown that the associated XEC weighting fraction, x∗, between these limits provides a metric by which strain anisotropy can be quantified. Experimental values of x∗, as determined by a linear regression scheme of diffraction data collected from multiple reflections, reveal the degree of strain anisotropy and its dependence on plastic deformation induced during in-situ and ex-situ thermal treatments.
Conal E. Murray, I.C. Noyan
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Lia Krusin-Elbaum, D. Shakhvorostov, et al.
Applied Physics Letters
Conal E. Murray, Paul R. Besser, et al.
Journal of Materials Research
Conal E. Murray, Andrew Ying, et al.
Powder Diffraction