Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
A force microscope has been used to deposit and image localized charge on insulating surfaces. The charge is deposited either by applying a voltage pulse to the microscope tip or by contact charging the insulator surface with the tip. An improved mode of charge imaging is presented, which distinguishes between charge and topography and allows the sign of the charge to be determined in a single scan. © 1990, American Vacuum Society. All rights reserved.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films