T.R. McGuire, R.C. Taylor
Journal of Applied Physics
The CrO2 thin films epitaxially on TiO2(100) and Al2O3(0001) substrates were successively grown. The films have been structurally characterized using ex situ RHEED, X-ray diffraction and ion channeling spectroscopy. A Curie temperature of around 393 K is observed for the films, with those grown on TiO2 exhibiting a large magneto-crystalline anisotropy. Transport measurements show that films on TiO2 have a resistivity drop of about two orders upon cooling down from room temperature to 5 K.
T.R. McGuire, R.C. Taylor
Journal of Applied Physics
J.Z. Sun, L. Krusin-Elbaum, et al.
IBM J. Res. Dev
A. Gupta, B.W. Hussey
Applied Physics Letters
W.A. Thompson, F. Holtzberg, et al.
Physical Review Letters