PaperEvent monitoring and service in a flat world benefits and challengesThomas M. ChengIT Professional
PaperAutomated Learning of Decision Rules for Text CategorizationChidanand Apté, Fred Damerau, et al.ACM Transactions on Information Systems (TOIS)
Conference paperPerformance data on new tunable attenuating PSM for 193nm and 157nm lithographyHans Becker, Frank Schmidt, et al.Photomask and Next-Generation Lithography Mask Technology 2004
