Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020
Paper
Mapping of short-range adhesive forces by scanning tunneling microscopy
Abstract
Detection of short-range interactions in combination with tunneling microscopy provides a means for characterizing the chemical nature of surfaces. Results are presented that demonstrate that carbon adsorbed on a rough, polycrystalline Ir surface can be detected on an atomic level. © 1994 The American Physical Society.