PaperVertex-Ant-Walk - A robust method for efficient exploration of faulty graphsVladimir Yanovski, Israel A. Wagner, et al.Ann. Math. Artif. Intell.
Conference paperBetter on wafer performance and mask manufacturability of contacts with no or non-traditional serifsDonald Samuels, Ian StobertSPIE Photomask Technology + EUV Lithography 2007
PaperExploring context and content links in social media: A latent space methodGuo-Jun Qi, Charu Aggarwal, et al.IEEE TPAMI
Conference paperTotal Source Mask Optimization: High-capacity, resist modeling, and production-ready mask solutionMoutaz Fakhry, Yuri Granik, et al.SPIE Photomask Technology + EUV Lithography 2011
