R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Proton-induced X-rays have been used for the measurement of mass absorption coefficients in the 0.1 to 1 keV energy range. In this technique the absorbing film is supported directly on a substrate which under proton bombardment will generate the characteristic substrate radiation whose absorption in the film will be measured. Results are given for twelve different metals at the B K alpha (184 eV) line.
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Imran Nasim, Melanie Weber
SCML 2024
K.A. Chao
Physical Review B
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films