Oliver C. Wells, Conal E. Murray, et al.
Review of Scientific Instruments
The emission of alpha particles from materials used to manufacture semiconductors can contribute substantially to the single-event upset rate. The alpha particles originate from contamination in the materials, or from radioactive isotopes, themselves. In this review paper, we discuss the sources of the radioactivity and the measurement methods to detect the emitted particles.
Oliver C. Wells, Conal E. Murray, et al.
Review of Scientific Instruments
Judson R. Holt, Anita Madan, et al.
Journal of Applied Physics
Conal E. Murray, Paul R. Besser, et al.
MRS Spring Meeting 2009
Stephan O. Hruszkewycz, Martin V. Holt, et al.
Optics Letters