Conference paper
SOI FinFET soft error upset susceptibility and analysis
Phil Oldiges, Ken Rodbell, et al.
IRPS 2015
The emission of alpha particles from materials used to manufacture semiconductors can contribute substantially to the single-event upset rate. The alpha particles originate from contamination in the materials, or from radioactive isotopes, themselves. In this review paper, we discuss the sources of the radioactivity and the measurement methods to detect the emitted particles.
Phil Oldiges, Ken Rodbell, et al.
IRPS 2015
Ken Rodbell, Michael S. Gordon, et al.
IEEE TNS
Conal E. Murray
Journal of Applied Physics
Praneet Adusumilli, Conal E. Murray, et al.
ECS Meeting 2009