Tak H. Ning
IEEE Transactions on Electron Devices
A simple method for determining both the emitter and the base series resistances of bipolar transistors from the measured I-V characteristics is described. The method is based on the observation that deviation of the base current from the ideal exp (qVBE/kT) behavior at high currents can be attributed solely and relatively simply to series resistances. Series resistances determined by this method are given for sample high-speed digital bipolar transistors. © 1984 IEEE
Tak H. Ning
IEEE Transactions on Electron Devices
Nicky Chau-Chun Lu, Tak H. Ning, et al.
IEEE Journal of Solid-State Circuits
Tak H. Ning, Peter W. Cook, et al.
IEEE JSSC
Tak H. Ning
ECS Meeting 2007