Tak H. Ning
VLSI Technology 2003
A simple method for determining both the emitter and the base series resistances of bipolar transistors from the measured I-V characteristics is described. The method is based on the observation that deviation of the base current from the ideal exp (qVBE/kT) behavior at high currents can be attributed solely and relatively simply to series resistances. Series resistances determined by this method are given for sample high-speed digital bipolar transistors. © 1984 IEEE
Tak H. Ning
VLSI Technology 2003
Jin Cai, Zhibin Ren, et al.
IEEE International SOI Conference 2008
Arvind Kumar, Tak H. Ning, et al.
VLSI Technology 2002
Tak H. Ning, Jin Cai
IEEE J-EDS