Michael F. Toney, Wen-Yaung Lee, et al.
Journal of Applied Physics
We report x-ray-diffraction measurements of the microstructural origin of circumferential magnetic anisotropy [or orientation ratio (OR), the ratio of the remanent magnetization along the circumferential and radial directions] in textured magnetic recording disks. We study a series of CoPtCrB magnetic media with CrX underlayers with varying OR and quantify the anisotropic strain in the CrX underlayer and the c-axis alignment in the hexagonal-close-packed media. Our data show that the c-axis alignment results from the anisotropic strain in the underlayer and suggest that the OR comes predominately from the media c-axis alignment. © 2006 American Institute of Physics.
Michael F. Toney, Wen-Yaung Lee, et al.
Journal of Applied Physics
Walter L. Prater, Emily L. Allen, et al.
Applied Physics Letters
Michael F. Toney, Ernesto E. Marinero, et al.
Journal of Applied Physics
Michael F. Toney, Sean Brennan
Physical Review B