PaperHigh speed electron beam testingGeorge Chiu, Jean-Marc Halbout, et al.Microelectronic Engineering
PaperNoncontact Internal Waveform Measurements with Picosecond Time Resolution on a 0.5-/xm CMOS SRAMYvon Pastol, Jean-Marc Halbout, et al.IEEE Electron Device Letters
PaperWaveform Measurements in High-Speed Silicon Bipolar Circuits Using a Picosecond Photoelectron Scanning Electron MicroscopePaul May, Jean-Marc Halbout, et al.IEEE T-ED
Conference paperAmplification of 25-ps AIGaAs Laser Diode Pulses at 1 kHz in Titanium-Doped SapphireSantanu Basu, Paul May, et al.ASSL 1989