Eric A. Joseph
AVS 2023
Controlled layer by layer material removal will be required for device fabrication in the future. Atomic level etch is a promising path to answer the processing demands of thin high mobility channel devices on the angstrom scale. Self-limiting reactions, discrete reaction & activation steps, or extremely low ion energy etch plasmas are some of the pathways being pursued for precise sub-nanometer material removal. Critical etch applications that require atomic layer control will be discussed, and promising approaches towards atomic layer etch will be reviewed in this talk.
Eric A. Joseph
AVS 2023
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Amlan Majumdar, Yanning Sun, et al.
IEEE T-ED
Hsinyu Tsai, Hiroyuki Miyazoe, et al.
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