PaperObservation of single charge carriers by force microscopyC. Schönenberger, S.F. AlvaradoPhysical Review Letters
PaperSeparation of magnetic and topographic effects in force microscopyC. Schönenberger, S.F. Alvarado, et al.Journal of Applied Physics
PaperUnderstanding magnetic force microscopyC. Schönenberger, S.F. AlvaradoZeitschrift für Physik B Condensed Matter
PaperScanning tunneling microscopy as a tool to study surface roughness of sputtered thin filmsC. Schönenberger, S.F. Alvarado, et al.Journal of Applied Physics