PaperObservation of single charge carriers by force microscopyC. Schönenberger, S.F. AlvaradoPhysical Review Letters
PaperUnderstanding magnetic force microscopyC. Schönenberger, S.F. AlvaradoZeitschrift für Physik B Condensed Matter
PaperA differential interferometer for force microscopyC. Schönenberger, S.F. AlvaradoReview of Scientific Instruments
PaperScanning tunneling microscopy as a tool to study surface roughness of sputtered thin filmsC. Schönenberger, S.F. Alvarado, et al.Journal of Applied Physics