A. Alexandrou, J.A. Kash, et al.
Physical Review B
A new scheme for characterizing the quadratic optical nonlinearity of thin films grown on opaque substrates is proposed and demonstrated. This involved the measurement, as a function of the film thickness, of second-harmonic waves reflected from a film surface. The d36 coefficient of a ZnSe-on-GaAs film is estimated by this method to be 33±7 pm/V at the fundamental wavelength of 1.06 μm, which agrees reasonably well with the known value for the bulk crystal.
A. Alexandrou, J.A. Kash, et al.
Physical Review B
M. Ohashi, T. Kondo, et al.
Journal of Applied Physics
T. Fukuzawa, S. Kano, et al.
Surface Science
R.M. Macfarlane, A.Z. Genack, et al.
Journal of Luminescence