Conference paper
Thin film acousto-optic devices
E.G. Lean, J.M. White, et al.
Acousto-Optics: Device Development/Instrumentation/Applications 1976
A new and sensitive measurement technique of determining elastic properties of a thin film on a substrate based on harmonic generation of dispersive Rayleigh waves is demonstrated. The technique has a sensitivity of detecting a change of 0.001% in velocity due to the loading of the thin film. A damaged layer of about 20 Å on a mechanically polished LiNbO3 substrate is detectable. © 1971 The American Institute of Physics.
E.G. Lean, J.M. White, et al.
Acousto-Optics: Device Development/Instrumentation/Applications 1976
E.G. Lean, C.C. Tseng, et al.
Applied Physics Letters
W.H. Chen, E.G. Lean
Applied Physics Letters
E.G. Lean, C.C. Tseng
Journal of Applied Physics