T.K. Yee, B. Fan, et al.
Applied Optics
The time-averaged current induced by incident radiation across electronic tunneling junctions is shown experimentally and theoretically to have a highly nonlinear dependence on the field intensity for a range of tunneling barrier thickness.
T.K. Yee, B. Fan, et al.
Applied Optics
T.K. Gustafson, P.L. Kelley, et al.
Applied Physics Letters
S.M. Faris, N.F. Pedersen
Physica B+C
S.M. Faris, S.I. Raider, et al.
IEEE Transactions on Magnetics