Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
Using sputtered thin-film layered structures comprising Si/[8×(20- Ru/x Cu)] /(30-) Co/tCu Cu/30- Co /(150- Fe50Mn50) with x=8 and 12, we demonstrate that the oscillation in the coupling of the two Co layers as the Cu-layer thickness, tCu, is varied, is not accompanied by an oscillation in the amplitude of the magnetoresistance. Thus the previously reported oscillation in magnetoresistance in Fe/Cr, Co/Ru, Co/Cr, and Co/Cu multilayers is not a fundamental electronic effect but a consequence of the inability to vary consistently the angles between the magnetizations of these multilayers. © 1991 The American Physical Society.
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990