Soft x-ray diffraction of striated muscle
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Using sputtered thin-film layered structures comprising Si/[8×(20- Ru/x Cu)] /(30-) Co/tCu Cu/30- Co /(150- Fe50Mn50) with x=8 and 12, we demonstrate that the oscillation in the coupling of the two Co layers as the Cu-layer thickness, tCu, is varied, is not accompanied by an oscillation in the amplitude of the magnetoresistance. Thus the previously reported oscillation in magnetoresistance in Fe/Cr, Co/Ru, Co/Cr, and Co/Cu multilayers is not a fundamental electronic effect but a consequence of the inability to vary consistently the angles between the magnetizations of these multilayers. © 1991 The American Physical Society.
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
A. Krol, C.J. Sher, et al.
Surface Science
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films