Soft x-ray diffraction of striated muscle
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Using sputtered thin-film layered structures comprising Si/[8×(20- Ru/x Cu)] /(30-) Co/tCu Cu/30- Co /(150- Fe50Mn50) with x=8 and 12, we demonstrate that the oscillation in the coupling of the two Co layers as the Cu-layer thickness, tCu, is varied, is not accompanied by an oscillation in the amplitude of the magnetoresistance. Thus the previously reported oscillation in magnetoresistance in Fe/Cr, Co/Ru, Co/Cr, and Co/Cu multilayers is not a fundamental electronic effect but a consequence of the inability to vary consistently the angles between the magnetizations of these multilayers. © 1991 The American Physical Society.
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Ellen J. Yoffa, David Adler
Physical Review B
A. Krol, C.J. Sher, et al.
Surface Science
A. Reisman, M. Berkenblit, et al.
JES