Bert Voigtländer, Gerhard Meyer, et al.
Physical Review B
Paper
Novel optical approach to atomic force microscopy
Abstract
A sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy is described. The method was incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, were successfully performed.
Related
Bert Voigtländer, Gerhard Meyer, et al.
Physical Review B
Bruno Schuler, Wei Liu, et al.
Physical Review Letters
Niko Pavliček, Przemyslaw Gawel, et al.
Nature Chemistry