Yuhai Tu, G. Grinstein
Physical Review Letters
A solid-on-solid interface representation of the random-field Ising model is studied numerically in two dimensions. The interface width varies linearly with sample size, in agreement with simple energy-accounting arguments and recent theories which predict that two is the lower critical dimension of the random-field Ising model. © 1983 The American Physical Society.
Yuhai Tu, G. Grinstein
Physical Review Letters
E. Pytte, J.F. Fernandez
Journal of Applied Physics
M. B̈ttiker, Y. Imry, et al.
Physical Review B
G.A. Held, G. Grinstein
Applied Physics Letters