Yuhai Tu, G. Grinstein, et al.
Physical Review Letters
A solid-on-solid interface representation of the random-field Ising model is studied numerically in two dimensions. The interface width varies linearly with sample size, in agreement with simple energy-accounting arguments and recent theories which predict that two is the lower critical dimension of the random-field Ising model. © 1983 The American Physical Society.
Yuhai Tu, G. Grinstein, et al.
Physical Review Letters
M. Büttiker, Y. Imry, et al.
Physics Letters A
A. Douglas Stone, Y. Imry
Physical Review Letters
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Physical Review A