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Paperlow Temperature Silicon Epitaxy by Hot Wall Ultrahigh Vacuum/Low Pressure Chemical Vapor Deposition Techniques: Surface OptimizationB.S. Meyerson, E. Ganin, et al.JES
PaperA technique for comparing the bulk and surface structure of defects in thin films using the scanning transmission electron microscope.M.M.J. Treacy, W. Krakow, et al.Applied Physics Letters
PaperOn the mechanism of diffusion-induced boundary migrationD.A. Smith, A.H. KingPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
