Conference paperElectromigration and stress reliability in multilevel interconnect metallizationPaul S. Ho, M.A. Moske, et al.SPIE Microelectronic Processing 1992
PaperMeasurement of interface states in palladium silicon diodesHoward L. Evans, Xu Wu, et al.Journal of Applied Physics
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PaperThermal structural disorder and melting at a crystalline interfaceTue Nguyen, Paul S. Ho, et al.Physical Review B