O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
On-chip microstrip transmission lines have been measured on-wafer from below 1 GHz up to 110 GHz. Using different pad de-embedding techniques as well as a technique based on two transmission lines of different length, the characteristic transmission line parameters have been accurately determined. The results are compared against simulation results from an electromagnetic full-wave solution and the parametric IBM model which is available in the technology's design kit.
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering