Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Two algorithms are presented and analyzed, which compute the distance between any pair of leaves of a complete tree. The first algorithm is quite efficient, running in time 0(log2 distance) on a uniform-cost RAM. The second algorithm is somewhat less efficient, though it too runs on a uniform-cost RAM in time O(log2 distance); it is presented mainly because its validity depends on an interesting numerological descriptor of complete trees. © 1980, Taylor & Francis Group, LLC
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
George Markowsky
J. Math. Anal. Appl.
Nimrod Megiddo
Journal of Symbolic Computation
Ruixiong Tian, Zhe Xiang, et al.
Qinghua Daxue Xuebao/Journal of Tsinghua University