Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
This paper considers the number of inner iterations required per outer iteration for the algorithm proposed by Conn et al. [9]. We show that asymptotically, under suitable reasonable assumptions, a single inner iteration suffices.
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
L Auslander, E Feig, et al.
Advances in Applied Mathematics
W.F. Cody, H.M. Gladney, et al.
SPIE Medical Imaging 1994