Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Some theoretical and practical aspects of common random numbers (CRN) for variance reduction in simulation analysis are considered. A simple proof of the optimality of CRN is presented and the efficiency of this technique for variance reduction is discussed. Applications of CRN to production planning and inventory problems while using stochastic approximation are given. © 1984.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
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Linear Algebra and Its Applications
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IS&T/SPIE Electronic Imaging 1996
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