Hiroshi Ito, Reinhold Schwalm
JES
The melting transition of Xe monolayers adsorbed on a single-crystal exfoliated graphite substrate has been studied by high-resolution synchrotron x-ray scattering. At temperatures slightly above the melting transition the fluid phase has a high degree of orientational order. The results are discussed in the context of current theories of two-dimensional melting including the effects of the substrate. © 1985 The American Physical Society.
Hiroshi Ito, Reinhold Schwalm
JES
J.C. Marinace
JES
T. Schneider, E. Stoll
Physical Review B
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering