Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Demonstrates the importance of using the correct basis functions in evaluating transition matrix elements for many-particle systems containing both electrons and holes and resolves an inconsistency in the theoretically determined oscillator strength ratios for radiative decay of the (A 0X) complex.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
K.A. Chao
Physical Review B
P.C. Pattnaik, D.M. Newns
Physical Review B
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990