Oxide characterization and behavior at CuCu and CuCuO_x interfaces

K.N. Tu

Materials Science and Engineering: A

Julian J. Hsieh

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

R.W. Gammon, E. Courtens, et al.

Physical Review B

S. Cohen, T.O. Sedgwick, et al.

MRS Proceedings 1983