D. Bedau, H. Liu, et al.
Applied Physics Letters
Patterning damage in narrow trackwidth spin-valve sensors was studied. The resistance of the sensors increased with the width, while the giant magnetoresistance (GMR) ratio decreased with decreasing width. It was found that sensors patterned using a focused Ar ion beam showed a similar but much greater effect.
D. Bedau, H. Liu, et al.
Applied Physics Letters
J.Z. Sun, T.S. Kuan, et al.
SPIE IOPTO 2004
W.H. Rippard, A.C. Perrella, et al.
Applied Physics Letters
D. Bedau, H. Liu, et al.
Applied Physics Letters