M.J. Rooks, E. Kratschmer, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Patterning damage in narrow trackwidth spin-valve sensors was studied. The resistance of the sensors increased with the width, while the giant magnetoresistance (GMR) ratio decreased with decreasing width. It was found that sensors patterned using a focused Ar ion beam showed a similar but much greater effect.
M.J. Rooks, E. Kratschmer, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
R.H. Koch, J.A. Katine, et al.
Physical Review Letters
L. Folks, R.E. Fontana, et al.
Journal of Physics D: Applied Physics
C. Wang, Y.-T. Cui, et al.
Physical Review B - CMMP