Conference paper
Fast region analysis using standard image processing hardware
Wayne Niblack, Tai Truong, et al.
Electronic Imaging: Advanced Devices and Systems 1990
We have used a focused ion beam to directly pattern thin- film granular perpendicular Co70Cr18Pt12 media. By cutting trenches ∼6 nm deep in the ∼20 nm media, we have produced square arrays of magnetically isolated islands with periods in the range 65-500 nm. At periods below ∼130 nm we observe only single magnetic domains, which exhibit a rough "checker-board" pattern of upon ac demagnetization. We have patterned at densities of over 140 Gbit/in2.
Wayne Niblack, Tai Truong, et al.
Electronic Imaging: Advanced Devices and Systems 1990
H.A. Michelsen, C.T. Rettner, et al.
Surface Science
G. Hu, T. Thomson, et al.
Journal of Applied Physics
G. Hu, T. Thomson, et al.
Journal of Applied Physics