A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
We investigate the performance of linearly penalized likelihood estimators for estimating distributional parameters in the presence of data truncation. Truncation distorts the likelihood surface to create instabilities and high variance in the estimation of these parameters, and the penalty terms help in many cases to decrease estimation error and increase robustness. Approximate methods are provided for choosing a priori good penalty estimators, which are shown to perform well in a series of simulation experiments. The robustness of the methods is explored heuristically using both simulated and real data drawn from an operational risk context. © 2010 Elsevier B.V.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Kenneth L. Clarkson, K. Georg Hampel, et al.
VTC Spring 2007
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Photomask and Next-Generation Lithography Mask Technology 2004
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Proceedings of SPIE 1989