A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
An investigation of waveguide phase-shifting techniques was conducted for the purpose of establishing the design criteria for a device capable of meeting the following specifications: a phase-shift variable over a minimum range of 360° and a maximum phase error of ±5° at any phase setting over at last a 10 per cent frequency bandwidth. The dielectric loaded waveguide is the basis of a device which meets the design requirements. In this paper the analytical expressions applicable to the dielectric loaded waveguide cross section are derived using the transverse resonance procedure. A rigorous description of the propagation characteristics of this structure for various parameter values is obtained through the use of a high-speed computing machine. The excellent correlation between computed values and the data obtained from an experimental model is presented. © 1962, IEEE. All rights reserved.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
R.W. Gammon, E. Courtens, et al.
Physical Review B
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
R. Ghez, M.B. Small
JES