Richard Haight, Talia S. Gershon, et al.
Semiconductor Science and Technology
We describe an experiment designed to carry out photoelectron spectroscopy on individual nanowires of Si and Ge. Laser generated, 150 fs pulses of 200 nm light (6.2 eV) were focused onto a single Si or Ge nanowire; the ensuing photoemitted electrons were measured with 20 meV resolution. Fermi level locations within the individual Si and Ge nanowire band gaps and work functions of hydrogen terminated nanowires were measured. Polarization dependent electron emission was observed and compared with Mie theory. © 2007 American Institute of Physics.
Richard Haight, Talia S. Gershon, et al.
Semiconductor Science and Technology
Daeyoung Lim, Richard Haight
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Richard Haight, Xiaoyan Shao, et al.
Applied Physics Letters
Leizhi Sun, Richard Haight, et al.
Applied Physics Letters