Conference paper
Placement of multimedia blocks on zoned disks
Renu Tewari, Richard P. King, et al.
IS&T/SPIE Electronic Imaging 1996
A newly developed optical method for noninvasively measuring the switching activity of operating CMOS integrated circuit chips is described. The method, denoted as picosecond imaging circuit analysis (PICA) can be used to characterize the gate-level performance of such chips and identify the locations and nature of their operational faults. The principles underlying PICA and examples of its use are discussed.
Renu Tewari, Richard P. King, et al.
IS&T/SPIE Electronic Imaging 1996
Maciel Zortea, Miguel Paredes, et al.
IGARSS 2021
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IEEE Communications Magazine
Yvonne Anne Pignolet, Stefan Schmid, et al.
Discrete Mathematics and Theoretical Computer Science