E. Occhiello, F. Garbassi, et al.
Plasma Chemistry and Plasma Processing
The plasma-assisted etching of magnetron-sputtered polycrystalline tungsten films in CF4-H2 and CF4-O2 glow discharges has been studied as a function of ion energy using quartz-crystal microbalance methods supplemented by vacuum-transfer Auger electron spectroscopy and actinometric emission spectroscopy.
E. Occhiello, F. Garbassi, et al.
Plasma Chemistry and Plasma Processing
U. Gerlach-Meyer, J.W. Coburn, et al.
Surface Science
J.W. Coburn, Kenneth Lee
Journal of Applied Physics
K. Kehler, J.W. Coburn, et al.
JVSTA