Conference paper
Recent developments in holographic scanning
L.D. Dickson, R.S. Fortenberry, et al.
Proceedings of SPIE 1989
The present work describes the characterization of internally developed epoxy ridge optical waveguides which exhibit low propagation loss (0.3 dB/cm at 1.3 μm), high environmental stability (low sensitivity to moisture), have smooth walls (100 nm sidewall roughness), and high temperature stability (275°C). The techniques used to fabricate these waveguides are compatible with the planar processes used in the manufacture of high performance electronic packages. © 1990 SPIE.
L.D. Dickson, R.S. Fortenberry, et al.
Proceedings of SPIE 1989
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Proceedings of SPIE 1989
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