PaperStructure of thin lead oxide layers as determined by x-ray diffractionT.B. Light, J.M. Eldridge, et al.Journal of Applied Physics
PaperThermal forming of niobium oxide switchable resistorsK.C. Park, M. Berkenblit, et al.Journal of Electronic Materials
PaperAccommodation of misfit across the interface between crystals of semiconducting elements or compoundsJ.W. Matthews, S. Mader, et al.Journal of Applied Physics