Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
State-of-the-art resist for 193 nm lithography are analyzed with respect to possible resolution, photospeed and etch resistance. This paper describes this photoresist design study and emphasizes the many opportunities and challenges that the photoresist and semiconductor industry face with the unfolding of this technology.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
Peter J. Price
Surface Science
Lawrence Suchow, Norman R. Stemple
JES