D. Tian, H. Li, et al.
Physical Review B
Paper
Quantitative determination of evaporated Si films by neutron activation
Abstract
No abstract available.
Related
Y.S. Li, F. Jona, et al.
Physical Review B
S.H. Lu, D. Tian, et al.
Solid State Communications
L.L. Chang, L. Esaki, et al.
Applied Physics Letters