PaperAutomated analysis of evolving interfaces during in situ electron microscopyNicholas M. Schneider, Jeung Hun Park, et al.ASCI
PaperNanoscale evolution of interface morphology during electrodepositionNicholas M. Schneider, Jeung Hun Park, et al.Nature Communications
PaperAutomated analysis of evolving interfaces during in situ electron microscopyNicholas M. Schneider, Jeung Hun Park, et al.ASCI
PaperControl of Electron Beam-Induced Au Nanocrystal Growth Kinetics through Solution ChemistryJeung Hun Park, Nicholas M. Schneider, et al.Nano Letters
