Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
In this work, we report a study of negative bias temperature instability (NBTI) recovery in high-k/metal-gate p-channel field effect transistors (pFETs) with different interfaces. New results on the dependence of recovery on interface, stressing voltage (Vs), stressing temperature and stressing time (ts) are shown. © 2009 Elsevier B.V. All rights reserved.
T.N. Morgan
Semiconductor Science and Technology
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
P. Alnot, D.J. Auerbach, et al.
Surface Science
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures