Conference paper
3D integration ESD protection design and analysis
Souvick Mitra, Ephrem Gebreselasie, et al.
EOS/ESD 2015
TLP characterizations are derived from analyzing pulses going to and reflections coming back from the DUT. Unfortunately, secondary reflections echo between the TLP pulse generator and DUT producing extraneous stresses. Reflection control techniques are reviewed and new methods using reflection cancellation for VF-TLP, which prevent inverted voltage re-reflections, is described.
Souvick Mitra, Ephrem Gebreselasie, et al.
EOS/ESD 2015
Junjun Li, Robert Gauthier, et al.
EOS/ESD 2006
James Di Sarro, Kiran Chatty, et al.
IRPS 2007
Junjun Li, David Alvarez, et al.
IPFA 2006