David S. Kung
DAC 1998
It is shown that if formulas are used to compute Boolean functions in the presence of randomly occurring failures (as has been suggested by von Neumann and others), then 1) there is a limit strictly less than 1/2 to the failure probability per gate that can be tolerated, and 2) formulas that tolerate failures must be deeper (and, therefore, compute more slowly) than those that do not. © 1988 IEEE
David S. Kung
DAC 1998
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Fan Jing Meng, Ying Huang, et al.
ICEBE 2007
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990