Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
We consider the problem of fault diagnosis in multiprocessor systems. Processors perform tests on one another: fault-free testers correctly identify the fault status of tested processors, while faulty testers can give arbitrary test results. Processors fail independently with constant probability p < 1/2 and the goal is to identify correctly the status of all processors, based on the set of test results. For 0 < q < 1, q-diagnosis is a fault diagnosis algorithm whose probability of error does not exceed q. We show that the minimum number of tests to perform q-diagnosis for n processors is Θ(n log 1/q) in the nonadaptive case and n + Θ(log 1/q) in the adaptive case. We also investigate q-diagnosis algorithms that minimize the maximum number of tests performed by, and performed on, processors in the system, constructing testing schemes in which each processor is involved in very few tests. Our results demonstrate that the flexibility yielded by adaptive testing permits a significant saving in the number of tests for the same reliability of diagnosis.
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
John A. Hoffnagle, William D. Hinsberg, et al.
Microlithography 2003
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990