Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Paper

04 Feb 2004

Secondary defect formation in bonded silicon-on-insulator after boron implantation

View publication

Abstract

No abstract available.

Paper

Superconductivity of lanthanum intermetallic compounds with the Cu₃Au structure

R.J. Gambino, N.R. Stemple, et al.

Journal of Physics and Chemistry of Solids

Paper

Diffused Junctions in GaAs Injection Lasers

J.C. Marinace

JES

Paper

Kinetic model for the chemical vapor deposition of tungsten in the silane reduction process

Julian J. Hsieh

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Paper

(S)PEEC: Time- and Frequency-Domain Surface Formulation for Modeling Conductors and Dielectrics in Combined Circuit Electromagnetic Simulations

Dipanjan Gope, Albert E. Ruehli, et al.

IEEE T-MTT

View all publications