G. Mandel, F.F. Morehead, et al.
Physical Review
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
G. Mandel, F.F. Morehead, et al.
Physical Review
F.F. Morehead
Journal of Materials Research
F.F. Morehead, B.L. Crowder, et al.
Journal of Applied Physics
B.L. Crowder, F.F. Morehead
IEEE T-ED