Daniele Morpurgo, Riccardo Serenthà, et al.
International Immunology
Positron beam based lifetime spectra were measured for mesoporous low-dielectric constant (low-k) methyl-silsesquioxane (MSSQ) as a function of porogen load. The ortho-positronium (o-Ps) lifetime distributions for MSSQ films were evaluated using the maximum entropy method (MELT). The influence of statistics on bimodal or unimodal o-Ps lifetime distributions corresponding to closed pores is discussed in detail. The average o-Ps lifetime correlated with the R parameter, which is a measure of the 3γ fraction. In porous SiLK® films, there is no o-Ps lifetime longer than 10ns. This work showed that the positron lifetime technique is promising for studying the nanoporous structure of low-k films, but caution is required when interpreting positron lifetime results. © 2003 Elsevier Science Ltd. All rights reserved.
Daniele Morpurgo, Riccardo Serenthà, et al.
International Immunology
Keith Lloyd, Matteo Cella, et al.
BMC Medical Informatics and Decision Making
J. Michael Schmidt, Daby Sow, et al.
Neurocritical Care
Shashanka Ubaru, Lior Horesh, et al.
Journal of Biomedical Informatics