Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
We show, for the first time, that the near edge structure of the crystalline silicon L2, 3 edge in absorption spectroscopy at an energy resolution of 0.3 eV can be largely explained without invoking many-body effects, or core excitons. Previous attempts to compare experimental results with total density of final states, without matrix element weighting, have lead to erroneous interpretations. © 1990.
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Mark W. Dowley
Solid State Communications